The lock screen flaw disease now spreads to Sony Xperia Z and this one is the most easiest of them all. A Sony user Scott Reed has upload the above video giving a complete tutorial but you dont need one in this case.
After the Apple's iPhone 5 and Samsung's Galaxy SIII and Note which were made accessible through the flaw in the lock screen, now Xperia Z, the latest phone from Sony stable is diagnosed with the same disease. All you have to do is to press the emergency phone dialer. Once the Phone dialer window comes up, press the following USSD command *#*#7378423#*#* (or Service in simple English) on the phone’s emergency dialer. This USSD command serves to open up a various services menu that lets you view the status of the various sensors in the phone. Just find the NFC settings and press NFC diagnostic test. When the phone completes the test, press the home button on the screen's navigation bar and voila! you are into the phone.
Unlike iPhone or Samsung bug this one lets you access pretty much anything from the internal as well as external storage. The real matter of concern is that Sony released a update fix for bugs on Xperia Z only yesterday for the 'sudden death' issue in the original phone software and somehow this one managed to escape from right under Sony Engineers noses. This may be a routine lab test button which was left unattended by the engineers but has serious effects like allowing anybody to access your apps, photos, images and posting on your behalf.
Anyhow now a days it is better to keep all your phones in physical lock and key rather than risk some flaw in it which may allow anybody access to privy information. I would further suggest you to kindly not save any bank and personal information in form of notes or messages without inbuilt security software.
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